• Generates susceptibility maps (reproducing gun-test failures)
• Supports TLP up to 8 kV (tr < 300 ps)
• Automated error detection

When an ESD simulator (ESD gun) discharges into the DUT’s test points, current flows through the chassis and into the internal PCB. This current radiates electromagnetic fields, coupling into PCB components and traces, and induces unwanted voltages and currents in the circuit. These induced signals can cause functional disruptions or even catastrophic failures. However, a gun test alone cannot pinpoint the exact location of the failure.
With ESD scanning, the DUT enclosure is removed and the exposed PCB is directly approached using magnetic or electric field probes. Current from the TLP (Transmission Line Pulse) source is applied through the probe. The probe couples into components and traces on the PCB, locally reproducing the DUT’s malfunctions.

What ESD Scanning Provides

1. Emulates the electric and magnetic fields that induce voltages and currents in the circuit
2. Identifies the susceptibility level at specific locations on the PCB
3. Records the DUT’s response to the induced voltage or current
   - It is also possible to use a dedicated probe to directly inject current into the circuit and monitor the DUT’s response

For a demonstration, see the video: “Introduction to the SmartScan ESD Scanner (English)”.

ESD scanning is a powerful tool for pinpointing and debugging failures in accordance with IEC 61000-4-2. It can also be used to evaluate ESD-protected modules.

It is advisable to screen potentially problematic ICs or modules before assembling them into a completed system. By performing ESD scans, you can build a database of scan results for each product. This data provides valuable information for determining susceptibility levels to ESD immunity.

The ANSI/ESD SP14.5-2015 standard, approved in 2015, provides high-quality guidelines for near-field immunity testing using near-field probes to discharge static electricity on components, modules, and PCBs, helping to identify failure points. This testing method is highly effective for identifying the root causes of ESD-related problems.

TLP generates rectangular pulses with a 500 ps rise time. For the rationale behind using TLP as the source of ESD disturbances, please refer to the paper (in English) on API’s website.

Scanning can be automated using a Failure Detector. This allows operators to leave the scanner unattended until scanning is complete, significantly improving the efficiency of ESD scans. The device can monitor four analog and four digital inputs, outputs from photo sensors, and a 1 kHz microphone signal. It also includes AC relays (120–240 V) and NO/NC DC relays for cycling the DUT power, all controlled via software.

Since the definition of an error (how the error output is generated) can vary greatly depending on the product, the Failure Detector can be customized for each DUT and test. For more details, please contact us.

• ESD Scan
• RF Immunity
• Current Spread Path Scan
• SmartZap - Robotic ESD Gun Tester