• Application of SAR (Synthetic Aperture Radar) technology to emissions
• Verification of far-field noise sources and far-field prediction (applicable above 5 GHz)

The basic concept of ESM (Emission Source Microscopy) is the application of SAR technology to EMC measurements. The technique scans the non-reactive near-field region—where most evanescent waves have decayed—typically 2λ-3λ from the source. The measured phase information is processed efficiently in k-space and focused at the DUT surface height to identify propagating wave sources.
Spatial resolution is limited by the Abbe diffraction limit of the optical system; therefore, higher frequencies provide finer spatial resolution.

For more details, please refer to the relevant English-language paper.

[Link to video]

• SmartScan-ESM software
• VNA (Vector Network Analyzer)
• Waveguide (or antenna)
• RF amplifier

Note on Waveguide (or Antenna):

API provides two sets of open-ended waveguides with horn antennas for the X-band. Customers may also use waveguides for other frequency bands. As long as the hardware supports it, there are no software-imposed restrictions based on the measured frequency.

Please also see our Rohde & Schwarz products

• EMI Scan
• Phase Measurement
• Near-field to Far-field Conversion
• ESM Noise Emission Microscopy
• Resonance Scan