Emission Features

  • Emission Features

EMI Scan

  • Wide probe selection covering 10 kHz to 40 GHz
  • Compatible with leading Japanese industrial robots (Mitsubishi, DENSO, Epson) and non-metallic scanning platforms
  • Reliable, intuitive, and user-friendly software
  • Drivers available for major spectrum analyzers
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EMI scanning is the most common near-field scanning technique. It measures the electromagnetic field in the near-field region and maps the radiation amplitude and frequency across the DUT image in X and Y coordinates. From API’s library of over 100 proprietary probes, the optimal probe can be selected based on measurement frequency and DUT size.

Use Cases

  • Evaluating shielding effectiveness
  • Field calculations (converting measured power and voltage into mA/m and mV/m)
  • Locating near-field radiation sources
  • Intra-coupling analysis

Required Equipment

  • SmartScan-EMI software
  • Spectrum analyzer
  • EMI probes
  • RF amplifier

Please also see our Rohde & Schwarz products

Rohde & Schwarz products

Shielding Effectiveness Evaluation

API has provided SEE scanning services and scanner packages to some of the world’s leading mobile device manufacturers and IC suppliers. To minimize measurement variability caused by accessories such as probes, RF amplifiers, and cables, comparisons are made using the electric field value at the probe tip, rather than the spectrum analyzer’s typical power output, across various shielding configurations.

SmartScan SEE Scanner Package includes:

EMI probes up to 40 GHz

See details here. API’s 0.5 mm and 1.0 mm HX/Y probes deliver sufficient spatial resolution for small DUTs such as ICs. For even higher resolution, 0.1 mm and 0.25 mm HX/Y probes are available.

Field calculation software and hardware
Shielding tents and mini-chambers

API manufactures shielding tents in a variety of sizes, providing over 30 dB of shielding at the 1 GHz band—fully meeting the requirements for SEE test scans. Commercially available mini-chambers can also be integrated with the SmartScan SEE package.

Field Calculation

For deeper analysis, electric field values at the probe tip are often more useful than raw power or voltage measurements. The Field Calculation Module converts power (dBm) or voltage (dBV) measured by the spectrum analyzer into H-field (mA/m) or E-field (mV/m), depending on the probe used.
API offers three hardware sets optimized for different frequency ranges: up to 10 GHz, up to 18 GHz, and up to 40 GHz. Each hardware set includes:

  • Probes covering the specified frequency range
  • Field source structures (50 Ω microstrip line or coplanar waveguide) for accurate system factor extraction

Emission Features

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+81-6-6377-2451

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